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Projections for Resolving Delaunay Encroachment

Eastlick, Mark, Carlos Bedregal

Research Notes, 26th International Meshing Roundtable, Sandia National Laboratories, September 18-21 2017


26th International Meshing Roundtable
Barcelona, Spain
September 18-21, 2017

Mark Eastlick, Silvaco Europe Ltd., GB,
Carlos Bedregal, Silvaco, Inc., US,

Research Note Abstract
An efficient method for sampling the features of piecewise smooth domains in the context of restricted Delaunay triangulation is presented. This scheme is based on off-center refinement and is designed to minimize the number of samples needed to correctly resolve the topology of the input. Nearest-point projection is used in regions away from features intersecting at acute angles and circular projection avoids the explicit protection machinery used by other methods where such sharp features occur. A comparison with two standard approaches is provided which demonstrates the significant reduction of vertices on termination of the processes.

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